Please use this identifier to cite or link to this item:
http://hdl.handle.net/11701/11304
Title: | Investigations of electronic properties of one-dimensional conductors using modern methods of electron beam lithography |
Other Titles: | Исследования электронных свойств одномерных проводников с использованием современных методов электронной литографии |
Authors: | Михайловский Владимир Юрьевич Варыгин Георгий Владимирович Varygin Georgii Вывенко Олег Федорович Vyvenko Oleg Fedorovich |
Issue Date: | 2017 |
URI: | http://hdl.handle.net/11701/11304 |
Appears in Collections: | BACHELOR STUDIES |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
diplom.docx | Article | 2,99 MB | Microsoft Word XML | View/Open |
reviewSV_Varygin_G_V__bak_otz.docx | ReviewSV | 17,14 kB | Microsoft Word XML | View/Open |
reviewSV_Varygin_G_V__bak_rec.pdf | ReviewRev | 253,29 kB | Adobe PDF | View/Open |
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