Please use this identifier to cite or link to this item:
http://hdl.handle.net/11701/11655
Title: | Noise spectroscopy of secondary emission in a semiconductor microcavity |
Other Titles: | Спектроскопия шумов вторичного свечения полупроводникового микрорезонатора |
Authors: | Смирнов Дмитрий Сергеевич Беляев Леонид Юрьевич Beliaev Leonid Запасский Валерий Сергеевич Zapasskii Valerii Sergeevich |
Issue Date: | 2017 |
URI: | http://hdl.handle.net/11701/11655 |
Appears in Collections: | MASTER'S STUDIES |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Master_thesis.pdf | Article | 4,6 MB | Adobe PDF | View/Open |
reviewSV_Belyaev_LYU_otzyv.pdf | ReviewSV | 1,77 MB | Adobe PDF | View/Open |
reviewSV_Report.pdf | ReviewRev | 635,42 kB | Adobe PDF | View/Open |
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