Please use this identifier to cite or link to this item:
Title: Noise spectroscopy of secondary emission in a semiconductor microcavity
Other Titles: Спектроскопия шумов вторичного свечения полупроводникового микрорезонатора
Authors: Смирнов Дмитрий Сергеевич
Беляев Леонид Юрьевич
Beliaev Leonid
Запасский Валерий Сергеевич
Zapasskii Valerii Sergeevich
Issue Date: 2017
Appears in Collections:MASTER'S STUDIES

Files in This Item:
File Description SizeFormat 
Master_thesis.pdfArticle4,6 MBAdobe PDFView/Open
reviewSV_Belyaev_LYU_otzyv.pdfReviewSV1,77 MBAdobe PDFView/Open
reviewSV_Report.pdfReviewRev635,42 kBAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.