Structure of near-electrode dissociation-recombination layers under DC stress

Abstract

The paper deals with processes of current passage through motionless low-conducting liquid in plane-plane electrode system at the injection and dissociation mechanisms of charge formation. The feature of the study is the joint consideration of an approximate analytical solution and the computer simulation. The latter is carried out in dimensionless form, which increases the generality of the results. The analysis of the structure of near-electrode layers in the transient regime and at various ratios between the injection and dissociation mechanisms of charge formation was performed.