The role of repair process in UV-induced mutagenesis

Abstract

The radioresistance of yeast cell Sacch. cerevisiae is determined by several genes; their mutations result in the UV sensitivity (uvs₁ uvs₂) only or in the sensitivity to UV-light and ionizing radiation (xrs₂, xrs₄). li is established that the cells of radiosensitive mutants show higher capacity for photoreactivation than the wild type cells. The mutations uvsx and uvs2 increase the frequency of the UV-induced mutations to serinresistance sharply, but xrs2 and xrs₄ decrease it. The experimental and literary considered data allow to affirm that UV-induced mutations appear as errors in repair process.